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Lattice strains along S walls in a NiO crystal revealed by X‐ray transmission topography
Author(s) -
Shimomura Y.,
Nakahigashi K.
Publication year - 1970
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889870006878
Subject(s) - non blocking i/o , lattice (music) , condensed matter physics , x ray , materials science , crystallography , crystal structure , crystal (programming language) , optics , geometry , physics , chemistry , mathematics , biochemistry , acoustics , catalysis , programming language , computer science
S walls in NiO were observed simultaneously with T walls by the Lang technique. It is clarified that non‐uniform strains exist along S walls over ranges of about 10μ, whereas there is almost no indication for the existence of strained regions along T walls. The results agree well with simple theoretical estimates.