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X‐ray diffraction studies of the Hg–In alloy system
Author(s) -
Mascarenhas Y. P.
Publication year - 1970
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889870006325
Subject(s) - tetragonal crystal system , alloy , diffraction , phase diagram , crystallography , phase (matter) , electrical resistivity and conductivity , x ray crystallography , materials science , trigonal crystal system , chemistry , crystal structure , optics , metallurgy , physics , organic chemistry , quantum mechanics
The Hg–In phase diagram was investigated by X‐ray diffraction up to 55 at.% In. In the range 0–17 at.% In β phase, a primary solid solution of In in Hg was found. There is evidence for a β t phase at 17 at.% In for which a tetragonal b . c . cell ( a = b = 3.48, c = 3.310 Å) is proposed. At 50 at.% In the alloy crystallizes with a rhombohedral cell ( a 0 = 3.008 Å, α = 73°20′). These results correct some previous published phase‐diagrams and are consistent with residual resistivity curves.