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A new method of determining interplanar spacings with the back‐reflection X‐ray divergent beam technique
Author(s) -
Newman B. A.,
Shrier A.
Publication year - 1970
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889870006192
Subject(s) - reflection (computer programming) , beam (structure) , optics , physics , feature (linguistics) , x ray , total internal reflection , computational physics , computer science , linguistics , philosophy , programming language
A new technique is described for the determination of interplanar spacings from the pseudo‐Kossel lines obtained in back reflection with the X‐ray divergent beam apparatus. The main feature of the method is that it utilizes the coordinates of general points of the lines rather than their special geometrical properties. This provides a better precision and also enables interplanar spacings from incomplete lines to be determined.