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Application of Fourier analysis to the X‐ray diffraction pattern of filings of a face‐centred cubic copper–silicon–manganese alloy
Author(s) -
Vasudevan R.
Publication year - 1970
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889870006064
Subject(s) - copper , manganese , silicon , cubic crystal system , alloy , fourier transform , materials science , diffraction , stacking , stacking fault energy , face (sociological concept) , crystallography , metallurgy , optics , chemistry , physics , mathematics , nuclear magnetic resonance , mathematical analysis , social science , sociology
Estimates of the coherent domain size, root‐mean‐square strain, stacking‐fault energy etc ., have been made through an application of Fourier analysis methods for a face‐centred cubic copper–silicon–manganese alloy deformed by filling at room temperature. The results so obtained are compared with results arrived at by other methods and by other authors.