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Electron microscope system with electronic recording of intensity and energy
Author(s) -
Holmes R. J.,
Pollard I. E.,
Ryan C. J.
Publication year - 1970
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889870006040
Subject(s) - optics , microscope , electron microscope , electron , lens (geology) , diffraction , plasmon , materials science , voltage , intensity (physics) , optoelectronics , physics , quantum mechanics
A description is given of an electron microscope system equipped with computer controlled electronic counting and recording of microscope images and diffraction patterns. An electrostatic reverse‐field energy filter lens provides energy discrimination, and a unique insulated digital‐to‐analog converter provides computer control of the bias voltage added to the high voltage on the lens. Examples of scans across diffraction rings and thickness fringes in Al wedges are given showing the intensity from only the elastic electrons and from those electrons which have lost energy due to plasmon excitation.