Premium
Mise en evidence par topographies aux rayons X de la liaison entre les défauts de croissance et les anomalies de focalisation dans les analyseurs a quartz courbé
Author(s) -
Loupias G.,
Sauvage M.
Publication year - 1970
Publication title -
journal of applied crystallography
Language(s) - French
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889870006039
Subject(s) - materials science , physics , quartz , humanities , art , composite material
A relationship has been found between the distribution of internal faults in a sheet of quartz and the poor analyser quality obtained.