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A computer program for X‐ray line broadening analysis
Author(s) -
Rashid M. S.,
Altstetter C. J.
Publication year - 1970
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889870005800
Subject(s) - stacking , computer program , line (geometry) , stacking fault , fault (geology) , x ray , crystallography , materials science , computational physics , physics , optics , computer science , chemistry , nuclear magnetic resonance , geology , geometry , mathematics , seismology , operating system
A computer program has been written for the evaluation of the size of coherently diffracting domains, microstrains, and stacking fault probabilities for f.c.c. and h.c.p. single crystals. After correcting for instrumental effects, the Warren–Averbach analysis is applied to reflections which are not affected by stacking faults. The fault‐broadened peaks are then analyzed and the results plotted.