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X‐ray diffraction method for measurement of elastic strain
Author(s) -
Hnilička M.,
Fiedler R.
Publication year - 1970
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889870005782
Subject(s) - diffraction , strain (injury) , materials science , x ray , x ray crystallography , crystallography , optics , physics , chemistry , medicine
A method is suggested, using diffraction line displacements, to facilitate simultaneous determination of one‐dimensional strain in a particular direction in the surface of a polycrystalline material and of the lattice parameter corresponding to the unstressed state. A single exposure at perpendicular incidence of the primary X‐ray beam enables both values to be obtained. Full advantage is taken of the ratios of diffraction ring diameters.