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Comparison of small angle X‐ray scattering data obtained under different collimation conditions
Author(s) -
Weil C. G.,
Schmidt P. W.,
Janosi A.,
Sekora A.,
Kratky O.
Publication year - 1970
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889870005691
Subject(s) - collimated light , scattering , optics , x ray , physics , small angle x ray scattering , materials science , laser
Two different collimating systems have been used to obtain small angle X‐ray scattering data from the same colloidal silica suspension. Because of the different collimation conditions, the two uncorrected scattering curves are quite different. However, after collimation corrections are applied, the corrected curves are almost identical. This close agreement provides evidence for the reliability of the collimation correction procedures.