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Slit smearing effects in the Bonse–Hart small‐angle X‐ray diffractometer
Author(s) -
Gravatt C. C.,
Brady G. W.
Publication year - 1969
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889869007229
Subject(s) - slit , diffractometer , optics , range (aeronautics) , divergence (linguistics) , physics , limiting , materials science , scanning electron microscope , mechanical engineering , linguistics , philosophy , composite material , engineering
Slit smearing effects have been experimentally investigated for a typical Bonse–Hart small‐angle diffractometer. This instrument was found to satisfy the criteria for infinite slit‐height configuration for a wide range of angular divergence‐limiting schemes. Standard mathematical desmearing methods applied to the data show excellent agreement with scattering data obtained from an essentially slit‐correctionless instrument.