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A program to calculate the variance of X‐ray line profiles
Author(s) -
Hilleard R. J.,
Webster J. A.
Publication year - 1969
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889869006960
Subject(s) - variance (accounting) , line (geometry) , computation , measure (data warehouse) , computer program , variance components , basis (linear algebra) , computer science , algorithm , statistics , mathematics , data mining , geometry , programming language , accounting , business
The variance of a line profile as a measure of the breadth of the line has recently been given a sound theoretical basis and a computer program is described to perform the enormous amount of computation required in variance analysis.