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The significance of texture parameters in phase analysis by X‐ray diffraction
Author(s) -
Dickson M. J.
Publication year - 1969
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889869006881
Subject(s) - texture (cosmology) , diffractometer , diffraction , orientation (vector space) , materials science , intensity (physics) , phase (matter) , austenite , x ray , x ray crystallography , crystallography , mathematics , optics , metallurgy , geometry , physics , composite material , image (mathematics) , chemistry , computer science , artificial intelligence , microstructure , scanning electron microscope , quantum mechanics
The theory of the direct comparison X‐ray method of phase analysis is extended to correct for preferred orientation effects. Texture parameters are defined to assess the type and intensity of preferred orientation using data from diffractometer patterns. The analysis is illustrated with results obtained on three austenitic stainless steels.