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Refraction X par les trichites de cuivre
Author(s) -
Latiere H. J.
Publication year - 1969
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889869006534
Subject(s) - refraction , whiskers , optics , diffraction , materials science , physics , composite material
The refraction of X‐rays may have an effect on the radiographs and topographs of whiskers with a polygonal cross‐section. With the usual diffraction methods there is no perceptible deviation but the phenomenon is visible with the Lang method and perfect crystals, such as whiskers.