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Quantitative Zuordnung von röntgenographisch und mittels chemischer Ätzgruben erfassten Versetzungen bei einer Siliziumprobe
Author(s) -
Renninger M.,
Theis W.
Publication year - 1969
Publication title -
journal of applied crystallography
Language(s) - German
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889869006522
Subject(s) - chemistry
An example is reported of a one to one correspondence of dislocations observed by chemical etch pits and by X‐ray topography in a 14 mm diameter silicon slice.
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