Premium
X‐ray topographic description of mode in a vibrating crystal
Author(s) -
Wagner C. E.,
Young R. A.
Publication year - 1969
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889869006467
Subject(s) - optics , diffraction , bragg's law , reflection (computer programming) , polarization (electrochemistry) , crystal (programming language) , resonator , displacement (psychology) , physics , diffraction topography , materials science , chemistry , computer science , psychology , psychotherapist , programming language
X‐ray diffraction topography can be used to describe ultrasonic vibrational modes in resonating crystals. Dependence of intensity enhancement on Bragg reflection and on the vibrational displacement parallel to the diffraction vector allows the determination of the polarization direction and positional details of the standing waves to be made with four or five topographs in simple cases. In an SL‐cut quartz resonator designed to operate at 455 kHz the principal mode is thereby shown to be third‐order face shear.