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The crystal structure of arsenic at 4.2, 78 and 299°K
Author(s) -
Schiferl D.,
Barrett C. S.
Publication year - 1969
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889869006443
Subject(s) - arsenic , lattice constant , analytical chemistry (journal) , crystallography , bond length , crystal structure , chemistry , materials science , physics , diffraction , optics , chromatography , organic chemistry
The lattice constants and the atomic position parameter, z , of a high purity, low strain, single‐crystal of arsenic have been determined. Low extinction reflections of filtered Mo K α and Ag K α radiation were used for the determination of z . The Bond precision technique with Mo K α radiation was used for the determination of the unit‐cell dimensions a and c . Average values for a and c in Å, and for z are: 4.2°K z = 0.22764 a = 3.7597 c = 10.4412; 78°K z = 0.22754 a = 3.7595 c = 10.4573; 299±3°K z = 0.22707 a = 3.7598 c = 10.5475. The estimated standard deviation of z is ±0.00004 at 4.2°K, ±0.00002 at 78°K and ±0.00005 at 299°K. The precision of a is estimated to be ±0–0001 Å and that for c to be ±0.0002 Å. The results for As are compared with those reported earlier for Sb and Bi.

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