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Characterization of phases in the 50–60 at. % Te region of the Bi–Te system by X‐ray powder diffraction patterns
Author(s) -
Brebrick R. F.
Publication year - 1968
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889868005406
Subject(s) - powder diffraction , diffraction , analytical chemistry (journal) , homogeneity (statistics) , materials science , hexagonal crystal system , phase (matter) , crystallography , phase diagram , x ray , chemistry , optics , physics , chromatography , mathematics , statistics , organic chemistry
Samples in the Bi–Te system containing 59.0, 58.0, 57.0, 55.0, 51.0, and 50.0 at.% Te, in addition to 5 samples within the Bi 2 Te 3 homogeneity range, have been equilibrated near 525 or 450°C and room temperature powder diffraction patterns taken. There are now 4 known phases in the 50–60 at.% Te region. The 59.0 and 58.0 at.% samples are two phase at 525°C. The 57.0 and 55.0 at.% samples are new phases with hexagonal parameters, a = 4.4106±0.0002 Å, c = 54.330±0.003 Å and a = 4.4214±0.0004 Å, c = 78.195±0.012 Å, respectively. The 51.0 and 50.0 at.% samples are two‐phase at 525 C. At 450°C the 51.0 at.% sample is single phase while the 50.0 at.% sample probably is not. The common indexing scheme for the 50.0 and 51.0 at.% samples is different from those for the 55–0 and 57.0 at.% samples. For the 51.0 at.% sample a = 4.4296±0.0002 Å and c = 24.017±0.001 Å. The 00 l lines for all these phases vary strongly with composition and those near d = 9 and 5 Å are isolated enough to provide a convenient way of distinguishing among the various phases. The results are discussed in terms of other phase‐diagram information. They are inconsistent with Stasova's correlation between composition and powder‐pattern indices for the Bi–Te, Bi–Se, and Sb–Te systems.