Premium
On choosing off‐line automatic X‐ray diffractometers
Author(s) -
Davis M. F.,
Groter C.,
Kay H. F.
Publication year - 1968
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889868005364
Subject(s) - line (geometry) , computer science , x ray , engineering drawing , optics , physics , engineering , mathematics , geometry
The significance of the important crystallographic design requirements of three and four circle automatic diffractometers is described. The extent to which the various available diffractometers meet these requirements is presented in tabular form.