Premium
On variance as a measure of line broadening in diffractometry: effect of a distribution of sizes on the apparent crystallite size
Author(s) -
Wilson A. J. C.
Publication year - 1968
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889868005315
Subject(s) - crystallite , skewness , range (aeronautics) , diffractometer , limit (mathematics) , line (geometry) , materials science , measure (data warehouse) , variance (accounting) , mathematics , statistics , analytical chemistry (journal) , chemistry , mathematical analysis , geometry , composite material , chromatography , metallurgy , accounting , computer science , scanning electron microscope , business , database
If the crystallites making up a diffractometer specimen have a number‐average size 〈 p 〉, and the distribution function of crystallite sizes has a variance W and skewness γ, the crystallite size obtained from the slope of the variance‐range curve will beand that obtained from the intercept will beEven when W and γ are unknown these equations set an upper limit of p 2 2 / p 1 to 〈p〉; for Langford's submicron nickel this limit is 121 Å.