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A test object and criteria for high resolution electron microscopy
Author(s) -
Heidenreich R. D.,
Hess W. M.,
Ban L. L.
Publication year - 1968
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889868004930
Subject(s) - magnification , optics , resolution (logic) , electron microscope , microscope , object (grammar) , calibration , image quality , power (physics) , micrograph , materials science , diffraction , computer science , image (mathematics) , physics , artificial intelligence , quantum mechanics
The desirability and requirements for a specimen capable of testing the resolving power and other image characteristics of an electron microscope are discussed in detail. In this discussion, the underlying diffraction phenomena are particularly utilized. A partially graphitized carbon black is shown to satisfy the requirements extremely well and constitutes an easily prepared specimen for conducting tests of image quality in the molecular size range. The structure of the test object is known in detail with the result that readily interpretable phase contrast images are obtained. Micrographs illustrating the use of the 3.4 Å (002) spacing for magnification calibration, astigmatism and asymmetry check as well as resolving power are exhibited. The second order c ‐spacing of 1.7 Å is occasionally found in an image. The micrographs shown herein were taken with two different electron microscopes by different operators obtaining the same structural detail in the images. It is concluded that the carbon black test object offers the best possibilities for evaluating image performance of any specimen yet suggested.