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First laboratory X‐ray diffraction contrast tomography for grain mapping of polycrystals
Author(s) -
King A.,
Reischig P.,
Adrien J.,
Ludwig W.
Publication year - 2013
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889813022553
Subject(s) - tomography , materials science , orientation (vector space) , x ray tube , x ray , diffraction , projection (relational algebra) , grain boundary , synchrotron radiation , optics , magnification , contrast (vision) , geometry , physics , microstructure , composite material , mathematics , algorithm , anode , quantum mechanics , electrode
The first results of three‐dimensional grain mapping using a laboratory tomograph equipped with a microfocus W target X‐ray tube source, operated at 90 kV and 350 µA, are presented. Adapted algorithms exploit the polychromatic radiation spectrum and the projection magnification arising from the cone‐beam geometry. The first map of grain shapes and crystallographic orientations from a titanium sample containing 42 grains is presented and its validity confirmed by a phase contrast reconstruction of the grain boundaries. Perspectives are given for the further development of the technique to accommodate samples with more grains or with greater intragranular orientation spread.