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Fourier crystal diffractometry based on refractive optics
Author(s) -
Ershov Petr,
Kuznetsov Sergey,
Snigireva Irina,
Yunkin Vyacheslav,
Goikhman Alexander,
Snigirev Anatoly
Publication year - 2013
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889813021468
Subject(s) - optics , fourier transform , bragg's law , materials science , refractive index , diffraction , reflection (computer programming) , grating , fourier optics , fourier analysis , physics , quantum mechanics , computer science , programming language
X‐ray refractive lenses are proposed as a Fourier transformer for high‐resolution X‐ray crystal diffraction. By employing refractive lenses the wave transmitted through the object converts into a spatial intensity distribution at its back focal plane according to the Fourier‐transform relations. A theoretical consideration of the Fourier‐transform technique is presented. Two types of samples were studied in Bragg reflection geometry: a grating made of strips of a thin SiO 2 film on an Si substrate and a grating made by profiling an Si crystal. Fourier patterns recorded at different angles along the rocking curves of the Si 111 Bragg reflection were analysed.