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High‐resolution X‐ray diffraction and imaging
Author(s) -
Fewster Paul F.,
Baidakova Marina V.,
Kyutt Reginald
Publication year - 2013
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889813016415
Subject(s) - diffraction , resolution (logic) , x ray , high resolution , optics , materials science , crystallography , physics , geology , computer science , remote sensing , chemistry , artificial intelligence
This issue of Journal of Applied Crystallography includes some highlights of the 11th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP), held in St Petersburg in 2012.