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Validation of three‐dimensional diffraction contrast tomography reconstructions by means of electron backscatter diffraction characterization
Author(s) -
Syha Melanie,
Trenkle Andreas,
Lödermann Barbara,
Graff Andreas,
Ludwig Wolfgang,
Weygand Daniel,
Gumbsch Peter
Publication year - 2013
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188981301580x
Subject(s) - electron backscatter diffraction , characterization (materials science) , materials science , diffraction , crystallite , resolution (logic) , electron diffraction , diffraction tomography , optics , context (archaeology) , strontium titanate , tomography , orientation (vector space) , image resolution , grain boundary , crystallography , microstructure , geology , physics , chemistry , geometry , nanotechnology , computer science , mathematics , composite material , thin film , paleontology , artificial intelligence , metallurgy
Microstructure reconstructions resulting from diffraction contrast tomography data of polycrystalline bulk strontium titanate were reinvestigated by means of electron backscatter diffraction (EBSD) characterization. Corresponding two‐dimensional grain maps from the two characterization methods were aligned and compared, focusing on the spatial resolution at the internal interfaces. The compared grain boundary networks show a remarkably good agreement both morphologically and in crystallographic orientation. Deviations are critically assessed and discussed in the context of diffraction data reconstruction and EBSD data collection techniques.