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High‐quality quartz single crystals for high‐energy‐resolution inelastic X‐ray scattering analyzers
Author(s) -
Hönnicke Marcelo Goncalves,
Huang Xianrong,
Cusatis Cesar,
Koditwuakku Chaminda Nalaka,
Cai Yong Q.
Publication year - 2013
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889813004731
Subject(s) - resolution (logic) , scattering , physics , quartz , optics , high resolution , diffraction , x ray , computational physics , atomic physics , materials science , geology , remote sensing , artificial intelligence , computer science , composite material
Spherical analyzers are well known instruments for inelastic X‐ray scattering (IXS) experiments. High‐resolution IXS experiments almost always use Si single crystals as monochromators and spherical analyzers. At higher energies (>20 keV) Si shows a high energy resolution (<10 meV), at an exact symmetric back‐diffraction condition, since the energy resolution is given by the real part of the susceptibility or polarizability. However, at low energies (<10 keV), high energy resolution is difficult to achieve with Si. α‐SiO 2 (quartz) can be an option, since it offers high energy resolution at low energies. In this work, the characterization of high‐quality α‐SiO 2 is presented. Such characterization is made by high‐resolution rocking curve, topography and lattice parameter mapping in different samples from a single block. X‐ray optics with α‐SiO 2 for IXS at lower energies (from 2.5 to 12.6 keV) with medium to high energy resolution (from 90 to 11 meV) are proposed and theoretically exploited.