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X‐ray diffraction microscopy: emerging imaging techniques for nondestructive analysis of crystalline materials from the millimetre down to the nanometre scale
Author(s) -
Borbély András,
KaysserPyzalla Anke R.
Publication year - 2013
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889813004160
Subject(s) - nanometre , diffraction , microscopy , materials science , nanotechnology , scale (ratio) , optics , physics , quantum mechanics
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