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Dependence of the strain diffraction line broadening on ( hkl ) and sample direction in textured polycrystals
Author(s) -
Popa Nicolae C.,
Lungu George Adrian
Publication year - 2013
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889812051928
Subject(s) - diffraction , rietveld refinement , anisotropy , line (geometry) , materials science , sample (material) , strain (injury) , x ray crystallography , crystallography , phenomenological model , optics , condensed matter physics , physics , geometry , chemistry , mathematics , thermodynamics , medicine
A new phenomenological approach describing the dependence of the strain diffraction line breadth on direction in both crystal and sample is presented. For a negligibly small dependence on the direction in the sample, these models reduce to those for anisotropic strain broadening that already exist in the literature and which are implemented in popular Rietveld codes. The new model is appropriate for implementation in the Rietveld programs able to process simultaneously diffraction patterns recorded in multiple directions in a sample.