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Contrast in transmission X‐ray diffraction topographs of growth defects in the core of SrLaGaO 4 single crystals
Author(s) -
Malinowska Agnieszka,
LefeldSosnowska Maria,
Härtwig Jürgen
Publication year - 2013
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889812050522
Subject(s) - diffraction , materials science , beamline , synchrotron radiation , x ray crystallography , optics , diffraction topography , crystallography , crystal (programming language) , contrast (vision) , single crystal , physics , chemistry , beam (structure) , computer science , programming language
Defects in the core of SrLaGaO 4 single crystals, grown by the Czochralski method using a [001]‐oriented seed, were studied by transmission X‐ray diffraction projection topography. Topographs were taken with radiation from a laboratory source and with high‐energy radiation available at the ESRF beamline ID19 in Grenoble. The contrast of the investigated defect images was analysed for various diffraction vectors g and for various values of the product μ 0 t (μ 0 is the linear absorption coefficient and t the crystal thickness). This allowed the contrast formation to be studied as a function of absorption. The results of the analysis confirm the model of crystal lattice deformation around rod‐like volume defects in SrLaGaO 4 crystals.