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A superbright X‐ray laboratory microsource empowered by a novel restoration algorithm
Author(s) -
De Caro Liberato,
Altamura Davide,
Vittoria Fabio Alessio,
Carbone Gerardina,
Qiao Fen,
Manna Liberato,
Giannini Cinzia
Publication year - 2012
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889812042161
Subject(s) - optics , visibility , synchrotron radiation , scattering , synchrotron , deconvolution , algorithm , physics , noise (video) , beam (structure) , signal (programming language) , interference (communication) , computer science , channel (broadcasting) , artificial intelligence , telecommunications , image (mathematics) , programming language
The properties of nanoscale materials vary with the size and shape of the building blocks, which can be measured by (grazing‐incidence) small‐angle X‐ray scattering along with the mutual positions of the nanoparticles. The accuracy in the determination of such parameters is dependent on the signal‐to‐noise ratio of the X‐ray scattering pattern and on the visibility of the interference fringes. Here, a first‐generation‐synchrotron‐class X‐ray laboratory microsource was used in combination with a new restoration algorithm to probe nanoscale‐assembled superstructures. The proposed algorithm, based on a maximum likelihood approach, allows one to deconvolve the beam‐divergence effects from data and to restore, at least partially, missing data cut away by the beam stopper. It is shown that the combination of a superbright X‐ray laboratory microsource with the data‐restoring method allows a virtual enhancement of the instrument brilliance, improving signal‐to‐noise ratio and fringe visibility and reaching levels of performance comparable to third‐generation synchrotron radiation beamlines.