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An introduction to three‐dimensional X‐ray diffraction microscopy
Author(s) -
Poulsen Henning Friis
Publication year - 2012
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889812039143
Subject(s) - diffraction , synchrotron , materials science , crystallite , microscopy , x ray crystallography , crystallography , characterization (materials science) , x ray , optics , synchrotron radiation , advanced photon source , physics , chemistry , nanotechnology , particle accelerator , beam (structure)
Three‐dimensional X‐ray diffraction microscopy is a fast and nondestructive structural characterization technique aimed at studies of the individual crystalline elements (grains or subgrains) within millimetre‐sized polycrystalline specimens. It is based on two principles: the use of highly penetrating hard X‐rays from a synchrotron source and the application of `tomographic' reconstruction algorithms for the analysis of the diffraction data. In favourable cases, the position, morphology, phase and crystallographic orientation can be derived for up to 1000 elements simultaneously. For each grain its average strain tensor may also be derived, from which the type II stresses can be inferred. Furthermore, the dynamics of the individual elements can be monitored during typical processes such as deformation or annealing. A review of the field is provided, with a viewpoint from materials science.