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Patterson analysis for layer profile determination by neutron or X‐ray reflectometry
Author(s) -
Tun Zin
Publication year - 2012
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889812015075
Subject(s) - reflectometry , neutron reflectometry , neutron , reflectivity , optics , layer (electronics) , x ray reflectivity , plateau (mathematics) , unit (ring theory) , materials science , computational physics , physics , nuclear physics , computer science , mathematics , nanotechnology , mathematical analysis , neutron scattering , small angle neutron scattering , time domain , mathematics education , computer vision
The possibility of using Patterson analysis to interpret neutron or X‐ray reflectometry data has been critically examined in terms of a hypothetical case study. The technique yields a highly accurate layer profile model provided the data are measured with a beam geometry that gives rise to unit reflectivity at Q = 0 only, i.e. Q c = 0. For those cases where a plateau of unit reflectivity extends out to finite Q , i.e. Q c > 0, a distorted model is obtained. A strategy to significantly improve this initial estimate of the model is proposed and demonstrated.