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Grazing‐incidence in‐plane X‐ray diffraction on ultra‐thin organic films using standard laboratory equipment
Author(s) -
Neuschitzer Markus,
Moser Armin,
Neuhold Alfred,
Kraxner Johanna,
Stadlober Barbara,
Oehzelt Martin,
Salzmann Ingo,
Resel Roland,
Novák Jiří
Publication year - 2012
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889812000908
Subject(s) - diffraction , pentacene , diffractometer , optics , materials science , synchrotron radiation , x ray crystallography , ceramic , lattice constant , thin film , optoelectronics , physics , nanotechnology , composite material , thin film transistor , scanning electron microscope , layer (electronics)
A novel grazing‐incidence in‐plane X‐ray diffraction setup based on a commercial four‐circle diffractometer with a sealed‐ceramic copper X‐ray tube, upgraded with parabolic graded multilayer X‐ray optics and a one‐dimensional position‐sensitive detector, is presented. The high potential of this setup is demonstrated by a phase analysis study of pentacene thin films and the determination of in‐plane lattice constants of pentacene mono‐ and multilayers. The quality of the results compare well to studies performed at synchrotron radiation facilities.