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Dislocation density and Burgers vector population in fiber‐textured Ni thin films determined by high‐resolution X‐ray line profile analysis
Author(s) -
Csiszár Gábor,
Pantleon Karen,
Alimadadi Hossein,
Ribárik Gábor,
Ungár Tamás
Publication year - 2012
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889811053234
Subject(s) - substructure , dislocation , burgers vector , materials science , diffraction , scattering , nanocrystalline material , condensed matter physics , crystallography , optics , composite material , physics , chemistry , nanotechnology , structural engineering , engineering
Nanocrystalline Ni thin films have been produced by direct current electrodeposition with different additives and current density in order to obtain 〈100〉, 〈111〉 and 〈211〉 major fiber textures. The dislocation density, the Burgers vector population and the coherently scattering domain size distribution are determined by high‐resolution X‐ray diffraction line profile analysis. The substructure parameters are correlated with the strength of the films by using the combined Taylor and Hall–Petch relations. The convolutional multiple whole profile method is used to obtain the substructure parameters in the different coexisting texture components. A strong variation of the dislocation density is observed as a function of the deposition conditions.