Premium
X‐ray diffraction mapping on a curved surface
Author(s) -
Allahkarami Masoud,
Hanan Jay C.
Publication year - 2011
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889811042221
Subject(s) - diffraction , surface (topology) , tilt (camera) , rotation (mathematics) , optics , sample (material) , phase (matter) , geometry , grid , materials science , transformation (genetics) , physics , mathematics , chemistry , quantum mechanics , thermodynamics , biochemistry , gene
An efficient method for X‐ray diffraction data collection mapping on a given curved surface has been developed. The method uses a laser–video auto z alignment system to collect a map of heights on a fine mesh grid. It also reconstructs the surface geometry and determines surface normals on a three‐dimensional surface fit. An algorithm was used to calculate the required rotation and tilt angles to coincide the sample normal with the diffraction center before each exposure. A set of diffraction frames collected using this technique was analyzed in order to superimpose a phase transformation map onto a typical zirconia ceramic sample. With this method, mapping of phase and stresses on a complex surface has been demonstrated. This approach is broadly applicable to many important areas of study.