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Combined synchrotron X‐ray and image‐correlation analyses of biaxially deformed W/Cu nanocomposite thin films on Kapton
Author(s) -
Djaziri Soundes,
Renault PierreOlivier,
Hild François,
Le Bourhis Eric,
Goudeau Philippe,
Thiaudière Dominique,
Faurie Damien
Publication year - 2011
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889811030226
Subject(s) - kapton , materials science , nanocomposite , digital image correlation , synchrotron , composite material , beamline , thin film , ultimate tensile strength , synchrotron radiation , deformation (meteorology) , polyimide , diffraction , substrate (aquarium) , optics , nanotechnology , physics , beam (structure) , layer (electronics) , oceanography , geology
In situ biaxial tensile tests within the elastic domain were conducted with W/Cu nanocomposite thin films deposited on a polyimide cruciform substrate using a biaxial testing machine developed on the DiffAbs beamline at the Synchrotron SOLEIL. The mechanical behaviour of the nanocomposite was characterized at the micro‐ and macroscales using synchrotron X‐ray diffraction and digital image‐correlation techniques simultaneously. Strain analyses for equibiaxial and non‐equibiaxial loading paths were carried out. The results show that the two strain measurements match to within 1 × 10 −4 in the elastic domain for strain levels less than 0.3% and for both loading paths.