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Study of the influence of dopants on the crystalline perfection of ferroelectric glycine phosphite single crystals using high‐resolution X‐ray diffraction analysis
Author(s) -
Senthil Kumar Krishnamurthy,
Moorthy Babu Sridharan,
Bhagavannarayana G.
Publication year - 2011
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889811005140
Subject(s) - dopant , materials science , crystallography , crystallization , crystal (programming language) , diffractometer , single crystal , x ray crystallography , crystal structure , analytical chemistry (journal) , doping , diffraction , chemistry , optics , physics , optoelectronics , organic chemistry , chromatography , computer science , programming language
Good quality and optically transparent single crystals of pure and doped glycine phosphite (GPI) were grown by both solvent‐evaporation and temperature‐cooling techniques. Dopants were chosen in different categories, namely transition metals (Cr, Mn, Co, Ni, Zn, Mg, Cd), rare‐earth metals (Ce, Nd, La), dyes (rhodamine B, malachite green, fluorescein) and an amino acid ( l ‐proline). The concentration of dopants was chosen depending on the category of dopants and the quality of crystallization during the growth process. The crystalline perfection of the as‐grown pure and doped GPI crystals was investigated by high‐resolution X‐ray diffraction at room temperature. A multicrystal X‐ray diffractometer employing a well collimated and highly monochromated Mo K α 1 beam and set in the (+, −, −, +) configuration was employed. Most of the crystal specimens show excellent crystalline perfection. However, grain boundaries, low‐angle tilt boundaries, and vacancy and interstitial point defects were observed in some crystal specimens.