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Determining the energy‐dependent X‐ray flux variation of a synchrotron beamline using Laue diffraction patterns
Author(s) -
Dejoie Catherine,
Kunz Martin,
Tamura Nobumichi,
Bousige Colin,
Chen Kai,
Teat Simon,
Beavers Christine,
Baerlocher Christian
Publication year - 2011
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889810052015
Subject(s) - beamline , diffraction , synchrotron , flux (metallurgy) , crystal (programming language) , materials science , x ray crystallography , optics , crystallography , physics , chemistry , beam (structure) , metallurgy , computer science , programming language
Although the spectrum originating from a superconducting bending magnet is quasi‐continuous, it shows important intensity variations through its spectral range. A method to determine the incident energy‐dependent flux variation based on the comparison between observed intensities and the calculated intensities of a well known structure (calcite) is presented here. It is found that the measured flux is highly sensitive to the use of correct Debye–Waller factors for the atoms of the standard crystal. By using the measured flux curve, it was possible to unambiguously index the Laue diffraction pattern of a trigonal crystal structure in its hexagonal setting. This is a crucial but difficult first step for the determination of strain and stress in materials with this symmetry, such as quartz, Mg, Ti, Zn etc.