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X‐ray topography of diamond using forbidden reflections: which defects do we really see?
Author(s) -
Shiryaev Andrei A.,
Masiello Fabio,
Hartwig Jurgen,
Kupriyanov Igor N.,
Lafford Tamzin A.,
Titkov Sergey V.,
Palyanov Yuri N.
Publication year - 2011
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889810049599
Subject(s) - crystallographic defect , diamond , point (geometry) , lattice (music) , x ray , synthetic diamond , physics , condensed matter physics , crystallography , optics , materials science , geometry , chemistry , mathematics , composite material , acoustics
Natural and synthetic diamonds with various concentrations and types of point and extended defect were investigated using X‐ray topography employing allowed (111, 004) and forbidden (222) reflections. On the topographs of the forbidden reflections, weak stress fields from lattice imperfections and extended defects are readily observed. Comparison of the topographs with IR maps of the distribution of point defects suggests that certain types of point defect may increase the structure factors of the forbidden reflections.