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The software package ANAELU for X‐ray diffraction analysis using two‐dimensional patterns
Author(s) -
FuentesMontero Luis,
MonteroCabrera Maria Elena,
FuentesCobas Luis
Publication year - 2011
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889810048739
Subject(s) - diffraction , crystallite , texture (cosmology) , software package , software , representation (politics) , inverse , optics , x ray crystallography , computer science , materials science , crystallography , physics , geometry , image (mathematics) , mathematics , chemistry , artificial intelligence , programming language , politics , law , political science
A new software package for interpreting two‐dimensional diffraction diagrams is presented. The application capabilities include representation of single‐ and polycrystal structures with an inverse pole figure treatment of texture phenomena, measurement and analysis of diffraction signals, and different approaches to the modelling of two‐dimensional diffraction patterns obtained from both single‐crystal and polycrystalline samples. Particular consideration is given to the effect of axially symmetric textures on two‐dimensional diffraction patterns. An example showing the capabilities of the software is presented.