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Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Author(s) -
Eccles Kevin S.,
Stokes Stephen P.,
Daly Carla A.,
Barry Nicola M.,
McSweeney Sharon P.,
O'Neill Damian J.,
Kelly Dawn M.,
Jennings W. Brian,
Ní Dhubhghaill O. M.,
Moynihan Humphrey A.,
Maguire Anita R.,
Lawrence Simon E.
Publication year - 2011
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889810042561
Subject(s) - crystallography , electron crystallography , electron diffraction , diffraction , materials science , chemistry , physics , optics
An evaluation of the Bruker SMART X2S for the collection of crystallographic diffraction data, structure solution and refinement is carried out with a variety of materials with different electron densities, presenting some of the successes and challenges of automation in chemical crystallography.