Premium
Use of linear scans to obtain | F hkl | 2 and the integrated intensity
Author(s) -
Shayduk Roman
Publication year - 2010
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889810022491
Subject(s) - diffractometer , reciprocal lattice , reflection (computer programming) , optics , physics , reciprocal , polarization (electrochemistry) , intensity (physics) , structure factor , computational physics , computer science , nuclear magnetic resonance , diffraction , chemistry , scanning electron microscope , linguistics , philosophy , programming language
An alternative method for determining the structure factor of a Bragg reflection is described. For broad reflections, the structure factor can be obtained from linear scans through the reflection in reciprocal space. The best known geometry corrections, i.e. Lorentz, polarization and area (volume) factors, are properly taken into account. In modern diffractometers, scans in reciprocal space are standard operations controlled by the diffractometer software program. The necessary corrections and diffractometer slit settings for the use of the new method are described.