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Diffraction gratings as small‐angle X‐ray scattering calibration standards
Author(s) -
Nygård K.,
Bunk O.,
Perret E.,
David C.,
Van Der Veen J. F.
Publication year - 2010
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188981000467x
Subject(s) - diffraction , momentum transfer , optics , scattering , calibration , diffraction grating , materials science , diffraction efficiency , range (aeronautics) , silicon , grating , x ray crystallography , physics , optoelectronics , quantum mechanics , composite material
It is shown that diffraction gratings can be used as accurate momentum‐transfer calibration standards in small‐angle X‐ray scattering experiments. For demonstration purposes, a silicon diffraction grating with a period of 400 nm is used. The data exhibit 50 diffraction peaks evenly distributed in the momentum‐transfer range q = 0.0–0.8 nm −1 , a regime that is not accessible using the traditional silver behenate standard.