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Calibration of a silicon crystal for absolute nuclear spectroscopy
Author(s) -
Massa Enrico,
Mana Giovanni,
Kuetgens Ulrich,
Ferroglio Luca
Publication year - 2010
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889810001652
Subject(s) - lattice constant , optics , silicon , interferometry , calibration , analyser , diffraction , crystal (programming language) , spectrometer , spectroscopy , physics , materials science , optoelectronics , quantum mechanics , computer science , programming language
To tie the wavelengths of γ‐rays to a visible standard is a key element of accurate determinations of the Planck constant and of tests of the Einstein mass–energy equivalence. This link is achieved via small diffraction angle measurements and perfect single crystals, the lattice parameter of which is determined by combined X‐ray and optical interferometry. The present paper concerns the lattice parameter measurement of an Si crystal, of a natural isotopic composition, designed to be used both as the analyser crystal of an X‐ray interferometer and the reference grating of a γ‐ray spectrometer.