Premium
Differential quantitative analysis of background structure in energy‐filtered convergent‐beam electron diffraction patterns
Author(s) -
Nakashima Philip N. H.,
Muddle Barrington C.
Publication year - 2010
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889810000749
Subject(s) - electron diffraction , electron , diffraction , reflection (computer programming) , scattering , reflection high energy electron diffraction , physics , optics , computational physics , materials science , atomic physics , computer science , nuclear physics , programming language
Measurements of electronic structure in solids by quantitative convergent‐beam electron diffraction (QCBED) will not reach their ultimate accuracy or precision until the contribution of the background to the reflections in energy‐filtered CBED patterns is fully accounted for. Apart from the well known diffuse background that arises from thermal diffuse scattering of electrons, there is a component that has a much higher angular frequency. The present work reports experimental evidence that this component mimics the angular distribution of the elastically scattered electrons within each reflection. A differential approach to QCBED is suggested as a means of quantitatively accounting for the background in energy‐filtered CBED data.