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Energy‐dispersive Laue diffraction by means of a frame‐store pnCCD
Author(s) -
Send Sebastian,
Von Kozierowski Marc,
Panzner Tobias,
Gorfman Semen,
Nurdan Kivanc,
Walenta Albert H.,
Pietsch Ullrich,
Leitenberger Wolfram,
Hartmann Robert,
Strüder Lothar
Publication year - 2009
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889809039867
Subject(s) - diffraction , optics , synchrotron radiation , detector , resolution (logic) , energy (signal processing) , angular resolution (graph drawing) , x ray crystallography , radiation , frame (networking) , crystal structure , crystal (programming language) , sample (material) , materials science , synchrotron , image resolution , physics , chemistry , crystallography , computer science , telecommunications , programming language , mathematics , quantum mechanics , combinatorics , artificial intelligence , thermodynamics
A frame‐store pn‐junction CCD detector was applied to the energy‐dispersive X‐ray Laue diffraction study of a γ‐LiAlO 2 crystal with white synchrotron radiation. Exploiting the simultaneous spatial and energy resolution of the detector the crystallographic unit cell of γ‐LiAlO 2 could be determined without any a priori information about the sample. The potential for application in X‐ray structure analysis is tested by comparing experimental structure factors taken under a single exposure with those calculated from the known crystal structure. After correcting the measured spot intensities by angular and energy‐dependent parameters, the agreement between experimental and theoretical kinematical structure factors is better than 10%.