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Measurement of stress factors and residual stress of a film by in situ X‐ray diffraction during four‐point bending
Author(s) -
Ortolani Matteo,
Azanza Ricardo Cristy Leonor,
Scardi Paolo
Publication year - 2009
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889809035857
Subject(s) - residual stress , materials science , diffraction , bending , stress (linguistics) , composite material , in situ , point (geometry) , three point flexural test , optics , physics , geometry , mathematics , linguistics , philosophy , meteorology
A method is proposed for the simultaneous measurement of the stress factors and residual stress state of a film by in‐situ X‐ray diffraction during four‐point bending. The externally applied load acts as an additional degree of freedom in the stress–strain relation, which allows the problem to be solved for both residual stress and elastic moduli without assuming any grain interaction model. The procedure was tested on a galvanic nickel deposit and the predictions of existing grain interaction models were compared with the experimental results.