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Conoscopic method for determination of main refractive indices and thickness of a uniaxial crystal cut out parallel to its optical axis
Author(s) -
Dumitrascu Leonas,
Dumitrascu Irina,
Dorohoi Dana Ortansa
Publication year - 2009
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889809025709
Subject(s) - uniaxial crystal , optical axis , planar , optics , materials science , anisotropy , refractive index , optical microscope , wedge (geometry) , liquid crystal , microscope , interference (communication) , quartz , optoelectronics , composite material , scanning electron microscope , physics , channel (broadcasting) , computer graphics (images) , computer science , lens (geology) , electrical engineering , engineering
This paper presents a simplified data acquisition and analysis technique for use in determining the main refractive indices and thickness of a uniaxial anisotropic layer cut out parallel to the optical axis, by processing the conoscopic interference figures obtained using a polarizing microscope equipped with a CCD camera. For negative uniaxial crystals, the equations used permit the calculation of the optical sign of the studied material so it is not necessary to insert a quartz wedge into the conoscopic beam. The technique can also be applied to the study of liquid crystal layers in a planar orientation.