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High‐performance compact‐multi‐crystal analyzer for X‐ray diffractometer scans
Author(s) -
Toraya Hideo
Publication year - 2009
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889809008966
Subject(s) - spectrum analyzer , diffractometer , diffraction , optics , crystal (programming language) , diffraction topography , single crystal , materials science , detector , beam (structure) , physics , x ray crystallography , nuclear magnetic resonance , computer science , scanning electron microscope , programming language
A new high‐performance diffracted‐beam analyzer consisting of multiple pieces of a perfect crystal is proposed. The pieces of Ge(111) crystal are set so that their crystal lattice planes coincide with tangent planes of a logarithmic spiral function. Each piece of the crystal works in the same manner as a single‐crystal analyzer. An X‐ray beam diffracted from a specimen is diffracted successively by individual crystals of the analyzer, and these diffracted beams are detected separately by a one‐dimensional position‐sensitive detector. If the analyzer consists of, for example, ten pieces of crystal, ten diffraction patterns can be observed in a single diffractometer scan, and they can be integrated into a single diffraction pattern. Thus the resulting intensity becomes greater by one order of magnitude, while the angular resolution is the same as that of a single‐crystal analyzer. The geometrical aspects of the analyzer are described, and some experimental results are given.