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Combining precession electron diffraction data with X‐ray powder diffraction data to facilitate structure solution
Author(s) -
Xie Dan,
Baerlocher Christian,
McCusker Lynne B.
Publication year - 2008
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889808034377
Subject(s) - diffraction , electron crystallography , electron diffraction , powder diffraction , projection (relational algebra) , reflection (computer programming) , crystallography , precession , crystal structure , resolution (logic) , reflection high energy electron diffraction , x ray crystallography , electron , materials science , chemistry , physics , computational physics , optics , computer science , algorithm , condensed matter physics , programming language , artificial intelligence , quantum mechanics
Information derived from precession electron diffraction (PED) patterns can be used to advantage in combination with high‐resolution X‐ray powder diffraction data to solve crystal structures that resist solution from X‐ray data alone. PED data have been exploited in two different ways for this purpose: (1) to identify weak reflections and (2) to estimate the phases of the reflections in the projection. The former is used to improve the partitioning of the reflection intensities within an overlap group and the latter to provide some starting phases for structure determination. The information was incorporated into a powder charge‐flipping algorithm for structure solution. The approaches were first developed using data for the moderately complex zeolite ZSM‐5, and then tested on TNU‐9, one of the two most complex zeolites known. In both cases, including PED data from just a few projections facilitated structure solution significantly.