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Benefits of two‐dimensional detectors for synchrotron X‐ray diffraction studies of thin film mechanical behavior
Author(s) -
Geandier Guillaume,
Renault PierreOlivier,
Teat Simon,
Le Bourhis Eric,
Lamongie Bruno,
Goudeau Philippe
Publication year - 2008
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889808030823
Subject(s) - synchrotron , diffraction , materials science , crystallite , detector , reflection (computer programming) , optics , x ray crystallography , thin film , ultimate tensile strength , x ray , composite material , nanotechnology , physics , computer science , metallurgy , programming language
Performing a complete in situ mechanical property analysis of polycrystalline thin films using X‐ray diffraction is time consuming with most standard diffraction beamlines at synchrotron facilities and not realistic with laboratory diffractometers. Two‐dimensional detection is shown to enable relatively fast and reliable X‐ray strain measurements during in situ tensile testing of gold films deposited on polyimide substrates. Advantages and drawbacks in the use of two‐dimensional detectors for this type of analysis are discussed for two commonly used geometries: reflection and transmission.